B.S., Gannon University

   Ph.D., State University of New York at Buffalo

Research Interests:

The development and application of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), Atomic Force Microscopy (AFM), and X-ray Photoelectron Spectroscopy (XPS) to investigate structure-property relationships in organic and polymeric materials.

Recent Publications and Presentations:

P. A. Cornelio Clark, I. Z. Hyder, and L. A. Vratsanos, “The Application of Atomic Force Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry to Study Film Coalescence in Polymer Blends” Proceedings of the 2002 International Coatings Expo – Federation of Societies for Coatings Technology, 2002.

H. Cheng, P. A. Cornelio Clark, S. D. Hanton, and P. Kung, “Cationization Effect on the Molecular Weight Distribution of an Ethyoxylated Polymer: A Combined Theoretical and TOF-SIMS Study,” J. Phy. Chem. A, 2000, 104 (12), 2641 – 2647.

S. D. Hanton and P. A. Cornelio Clark, “Secondary Ion Mass Spectrometry as Related to Surface Analysis” in Encyclopedia of Analytical Chemistry – Applications, Theory, and Instrumentation, John Wiley and Sons, NY 2000, 11872 – 11893.

P. A. Lucas, P. A. Clark, R. J. Haney, and M. R. Kittek, “Investigation of Water Spot and Blush Resistance of Epoxy Industrial Floors,” Protective and Marine Coatings, 1998, 1, 8 20 – 27.

D. M. Parees, S. D. Hanton, P. A. Cornelio Clark, and D. A. Willcox,” “A Comparison of Mass Spectrometric Techniques for Generating Molecular Weight Information on a Class of Ethoxylated Oligomers,” J. Am. Soc. Mass Spectrom., 1998, 9, 4, 282 – 291.

Courses Taught by Dr. Clark

   CHM 100   Introductory Chemistry
   CHM 103   General Chemistry I
   CHM 104   General Chemistry II